Company Filing History:
Years Active: 2005-2011
Title: Innovations by Atsushi Muto
Introduction
Atsushi Muto is a prominent inventor based in Hitachinaka, Japan. He has made significant contributions to the field of charged particle beam devices and scanning electron microscopes. With a total of 4 patents to his name, Muto's work has advanced the capabilities of imaging technologies.
Latest Patents
One of Muto's latest inventions is a charged particle beam device. This device is designed to separately detect secondary signal particles emitted from the surface of a sample, as well as dark field and bright field signal particles. This innovation allows operators to observe images with optimal contrast based on specific applications. The device includes a transmitted signal conversion member that has an opening for bright field transmitted signal particles, along with a detection means for signals colliding against the conversion member.
Another notable invention is a scanning electron microscope. The objective of this invention is to provide a microscope that includes decelerating-electric-field forming means. This feature decreases the energy of the electron beam reaching the sample and allows for the selective detection of backscattered electrons (BSEs) with high efficiency. The microscope is equipped with a detector that receives electrons positioned outside the trajectories of secondary electrons, enhancing its imaging capabilities.
Career Highlights
Atsushi Muto is associated with Hitachi High-Technologies Corporation, where he continues to innovate in the field of advanced imaging technologies. His work has been instrumental in developing tools that enhance the precision and efficiency of electron microscopy.
Collaborations
Muto has collaborated with notable colleagues, including Yuusuke Tanba and Mitsugu Sato. Their combined expertise has contributed to the successful development of advanced technologies in their field.
Conclusion
Atsushi Muto's contributions to the field of charged particle beam devices and scanning electron microscopes have significantly impacted imaging technology. His innovative patents reflect a commitment to advancing scientific research and practical applications in microscopy.