This inventor holds 4 USPTO granted patents and 1 EPO patent. Top assignee: Canon Kabushiki Kaisha. Active years: 2015-2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015-2018
Title: Atsushi Maeda: Innovator in Optical Measurement Technologies
Introduction
Atsushi Maeda is a prominent inventor based in Utsunomiya, Japan. He has made significant contributions to the field of optical measurement technologies. With a total of 4 patents to his name, Maeda's work focuses on innovative methods and apparatuses for shape measurement and optical elements.
Latest Patents
Maeda's latest patents include a shape measuring method and apparatus, as well as a program and recording medium. One of his notable inventions involves a rotary stage that is controlled to two measurement positions along a rotational direction. This method detects the wavefront of reflected light from partial regions using a detector, allowing for precise movement of the object surface. The placement errors in the trajectory of the object surface are measured and estimated based on the detected wavefronts. Additionally, he has developed a lens array that includes multiple lenses designed to collect divided test light and form spots, with a light shielding mask that satisfies specific mathematical conditions of light transmission.
Career Highlights
Atsushi Maeda is currently employed at Canon Kabushiki Kaisha, a leading company in imaging and optical products. His work at Canon has allowed him to further his research and development in optical technologies, contributing to advancements in the industry.
Collaborations
Maeda collaborates with Hitoshi Iijima, another expert in the field, to enhance the development of innovative optical measurement solutions.
Conclusion
Atsushi Maeda's contributions to optical measurement technologies demonstrate his expertise and commitment to innovation. His patents reflect a deep understanding of the complexities involved in shape measurement and optical elements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
