IDiyas

For the Inventor, By the Inventor

Karnataka, India

Arvind Jain

USPTO Granted Patents = 9

Average Co-Inventor Count = 4.1

ph-index = 6

Forward Citations = 68(Granted Patents)


Location History:

  • Bengalooru, IN (2013 - 2014)
  • Karnataka, IN (2015 - 2024)

Company Filing History:

goldMedal9 out of 29,232 
 
Texas Instruments Corporation
 patents

Years Active: 2013-2024

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9 patents (USPTO):Explore Patents
1. 11921159 - Compressed scan chain diagnosis by internal chain observation, processes, circuits, devices and systems (2024-03-05),
2. 11592483 - Compressed scan chain diagnosis by internal chain observation, processes, circuits, devices and systems (2023-02-28),
3. 11119152 - Functional circuitry, decompressor circuitry, scan circuitry, masking circuitry, qualification circuitry (2021-09-14),
4. 10591540 - Compressed scan chains with three input mask gates and registers (2020-03-17),
5. 9952283 - Compressed scan chains with three input mask gates and registers (2018-04-24),
6. 9229055 - Decompressed scan chain masking circuit shift register with log2(n/n) cells (2016-01-05),
7. 9091729 - Scan chain masking qualification circuit shift register and bit-field decoders (2015-07-28),
8. 8887018 - Masking circuit removing unknown bit from cell in scan chain (2014-11-11),
9. 8438437 - Structures and control processes for efficient generation of different test clocking sequences, controls and other test signals in scan designs with multiple partitions, and devices, systems and processes of making (2013-05-07),

Title: Arvind Jain: Innovator in Electronic Scan Circuitry

Introduction

Arvind Jain is a prominent inventor based in Karnataka, India, known for his significant contributions to electronic scan circuitry. With a total of nine patents to his name, Jain has made remarkable advancements in the field of technology.

Latest Patents

Among his latest patents is the innovative "Compressed scan chain diagnosis by internal chain observation." This invention involves electronic scan circuitry that includes a decompressor, multiple scan chains fed by the decompressor, and a scan circuit that is coupled to the scan chains for scanning in and out. Additionally, it features a masking circuit fed by the scan chains and a scannable masking qualification circuit that holds scanned-in bits upon scan-out of the scan chains through the masking circuit. Other related processes, circuits, devices, and systems are also disclosed in his patents.

Career Highlights

Arvind Jain is currently employed at Texas Instruments Corporation, where he continues to develop cutting-edge technologies. His work has significantly impacted the efficiency and functionality of electronic devices.

Collaborations

Jain has collaborated with notable colleagues, including Sundarrajan Subramanian and Rubin Ajit Parekhji, contributing to various projects and innovations in the field.

Conclusion

Arvind Jain's contributions to electronic scan circuitry and his impressive portfolio of patents highlight his role as a leading inventor in the technology sector. His work continues to influence advancements in electronic systems and processes.

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