Jena, Germany

Arne Seyfarth

This inventor holds 1 USPTO granted patent. Top assignee: Carl Zeiss Sms Ltd.. Active years: 2014.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Arne Seyfarth: Innovator in Photolithographic Processes

Introduction

Arne Seyfarth is a notable inventor based in Jena, Germany. He has made significant contributions to the field of photolithography, particularly in the area of mask inspection and emulation processes. His innovative work has led to the development of a patented method that enhances the accuracy and efficiency of photolithographic processes.

Latest Patents

Arne Seyfarth holds a patent for a "Method for emulation of a photolithographic process and mask inspection microscope for performing the method." This patent addresses the critical need for accurate defect detection in mask inspection, ensuring that the aerial images generated in the resist are as identical as possible to those produced during wafer exposure. The method involves generating aerial images of at least two substructures, capturing one of these images with a mask inspection microscope, correcting any errors using a processing unit, and overlaying the images to create an overall aerial image.

Career Highlights

Arne Seyfarth is currently employed at Carl Zeiss SMS Ltd., a company renowned for its advanced optical systems and technologies. His work at this esteemed organization has allowed him to further develop his expertise in photolithography and contribute to cutting-edge innovations in the field.

Collaborations

Throughout his career, Arne has collaborated with talented professionals such as Eric Poortinga and Thomas Scherübl. These collaborations have fostered a creative environment that encourages the exchange of ideas and the advancement of technology in photolithography.

Conclusion

Arne Seyfarth's contributions to the field of photolithography through his innovative patent and collaborative efforts highlight his role as a key figure in advancing this technology. His work continues to influence the industry and improve processes related to mask inspection and emulation.

Profile summary based on public USPTO records.
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