Company Filing History:
Years Active: 2019-2020
Title: Anna Prokhodtseva: Innovator in Crystalline Sample Characterization
Introduction
Anna Prokhodtseva is a prominent inventor based in Eindhoven, Netherlands. She has made significant contributions to the field of materials science, particularly in the characterization of crystalline samples. With a total of 2 patents to her name, Anna's work is paving the way for advancements in electron microscopy techniques.
Latest Patents
Anna's latest patents include innovative methods for 3D defect characterization of crystalline samples in a scanning type electron microscope. This invention involves irradiating a sample on a stage, selecting a set of crystal lattice planes, and orienting them to a first Bragg condition. The process allows for obtaining Electron Channeling Contrast Images for areas of interest on the sample. Additionally, she has developed a method for sample orientation for Transmission Electron Microscopy (TEM) lamella preparation. This method utilizes electron channeling patterns to align substrates for ion beam milling, enhancing the evaluation of circuit processing.
Career Highlights
Anna Prokhodtseva is currently employed at FEI Company, where she continues to innovate and contribute to the field of electron microscopy. Her work has garnered attention for its practical applications in materials science and engineering.
Collaborations
Anna collaborates with notable colleagues, including Tomás Vystavel and Libor Strakos, who share her passion for advancing technology in the field.
Conclusion
Anna Prokhodtseva is a trailblazer in the realm of crystalline sample characterization, with her patents reflecting her dedication to innovation. Her contributions are instrumental in enhancing the capabilities of electron microscopy, making her a key figure in her field.