Company Filing History:
Years Active: 2019-2022
Title: Ankit Jain: Innovator in Wafer Inspection Technologies
Introduction
Ankit Jain is a prominent inventor based in Ballston Spa, NY (US), known for his significant contributions to the field of wafer inspection technologies. With a total of 7 patents to his name, Jain has developed innovative methods that enhance the efficiency and accuracy of defect detection in semiconductor manufacturing.
Latest Patents
Jain's latest patents include groundbreaking diagnostic methods for classifiers and the defects captured by optical tools. One of his notable inventions focuses on wafer inspection with stable nuisance rates and defect of interest capture rates. This technique is designed to discover newly appearing defects that occur during the manufacturing process. By utilizing a first wafer, defects of interest are identified based on classified filtered inspection results. For each subsequent wafer, the defect classifier is updated, allowing for the identification of defects of interest based on the classified filtered inspection results.
Another significant patent involves a system and method for training and applying defect classifiers in wafers that have deeply stacked layers. This invention provides a comprehensive approach to defect classification by acquiring a plurality of images generated by an inspection system at a defect location on a wafer. Each image is captured using a different focus setting, enabling a more accurate classification of the defect.
Career Highlights
Ankit Jain is currently employed at Kla Tencor Corporation, where he continues to push the boundaries of innovation in wafer inspection technologies. His work has been instrumental in advancing the capabilities of inspection systems, making them more effective in identifying defects that can impact the quality of semiconductor products.
Collaborations
Jain collaborates with talented professionals in his field, including Martin Plihal and Saravanan Paramasivam. These collaborations foster an environment of innovation and creativity, leading to the development of cutting-edge technologies.
Conclusion
Ankit Jain's contributions to wafer inspection technologies exemplify the impact of innovative thinking in the semiconductor industry. His patents not only enhance defect detection methods but also pave the way for future advancements in manufacturing processes.