Andrew C Davidson

Title: Innovations by Andrew C. Davidson

Introduction

Andrew C. Davidson is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of microwave device testing, holding a total of 4 patents. His work focuses on enhancing the performance measurement of photodetectors and microwave devices.

Latest Patents

One of his latest patents is a method for measuring the electrical and optical performance of on-wafer devices. This innovative approach allows for on-wafer testing of microwave devices, such as photodiodes, by implementing a biasing method that is applicable when the device is connected to the ground plane of the wafer. The method involves arranging elements with diode-like characteristics alongside the device, ensuring accurate measurements of performance parameters like responsivity and reflection coefficients. Another significant patent addresses the verification and correction of error models used in microwave-frequency measurements. This method focuses on correcting inaccuracies in error factors by comparing de-embedded measurements to known characteristics of verification standards.

Career Highlights

Andrew C. Davidson is currently employed at Cascade Microtech, Inc., where he continues to innovate in the field of microwave technology. His expertise has led to advancements in the testing and calibration of photodetectors, contributing to the overall efficiency and accuracy of microwave measurements.

Collaborations

Throughout his career, Davidson has collaborated with notable colleagues, including Eric W. Strid and Scott H. Rumbaugh. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Andrew C. Davidson's contributions to the field of microwave device testing and photodetector performance measurement are noteworthy. His innovative methods and collaborative efforts continue to advance technology in this specialized area.