The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 1991

Filed:

Nov. 28, 1989
Applicant:
Inventors:

Eric W Strid, Portland, OR (US);

Andrew C Davidson, Portland, OR (US);

Assignee:

Cascade Microtech, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324601 ; 324638 ; 36457101 ;
Abstract

A method for correcting inaccuracies in error factors of an error model used for vector-corrected, microwave-frequency measurements. Verifying de-embedded measurements are compared to known characteristics of at least one verification standard. At least one parameter of the calibration standards, or an error factor, or measuring network geometry, is changed and the error factors are recalculated to bring the verifying measurements into conformity with the known characteristics of the verification standard.


Find Patent Forward Citations

Strid, Eric. (1991). Verification and correction method for an error model for a measurement (U.S. Patent No. 5047725). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5047725

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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