Eindhoven, Netherlands

An Gao

This inventor holds 1 USPTO granted patent. Top assignee: Asml Netherlands B.v.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: An Gao. Retrieved from https://idiyas.com/inventor/an-gao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: The Inventive Mind of An Gao: Revolutionizing Semiconductor Devices in Eindhoven

Introduction: An Gao, a brilliant inventor based in Eindhoven, NL, has made significant contributions to the field of semiconductor devices with his groundbreaking patent for an information determining apparatus and method.

Latest Patents: An Gao holds one patent for an apparatus designed to determine information related to target alignment marks in semiconductor device substrates. The innovative device utilizes an energy delivery system that emits a laser beam to modify opaque layers on the substrate, enhancing transparency for optical signal propagation.

Career Highlights: An Gao is associated with the esteemed company ASML Netherlands B.V., where his inventive genius has flourished. His dedication to advancing semiconductor technology has led to the development of cutting-edge solutions for the industry.

Collaborations: Throughout his career, An Gao has collaborated closely with talented individuals such as Sanjaysingh Lalbahadoersing and Andrey Alexandrovich Nikipelov. Together, they have worked towards pushing the boundaries of innovation in semiconductor devices.

Conclusion: An Gao's pioneering work in the field of semiconductor devices stands as a testament to his innovative spirit and commitment to driving technological advancements. His patent serves as a milestone in the industry, showcasing his talent and expertise in revolutionizing semiconductor technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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