This inventor holds 1 USPTO granted patent. Top assignee: Nova Corporation. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Amir Sagiv: Innovator in Semiconductor Metrology
Introduction
Amir Sagiv is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of semiconductor device metrology. His innovative work focuses on enhancing the accuracy and efficiency of measurements in semiconductor technology.
Latest Patents
Amir Sagiv holds a patent for "Time-domain optical metrology and inspection of semiconductor devices." This patent involves creating a time-domain representation of wavelength-domain measurement data of light reflected by a patterned structure of a semiconductor device. The process includes selecting relevant and irrelevant portions of the time-domain representation and determining measurements of parameters of interest through model-based processing.
Career Highlights
Amir is associated with Nova Corporation, where he applies his expertise in semiconductor technology. His work has been instrumental in advancing metrology techniques that are crucial for the development of semiconductor devices.
Collaborations
Amir collaborates with talented professionals in his field, including Gilad Barak and Yishai Schreiber. Their combined efforts contribute to the innovative projects at Nova Corporation.
Conclusion
Amir Sagiv's contributions to semiconductor metrology exemplify the importance of innovation in technology. His patent and collaborative efforts continue to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile