Ami Sade

Title: The Innovative Contributions of Ami Sade

Introduction

Ami Sade is a prominent inventor based in Sunnyvale, California, known for her significant contributions to the field of metrology and substrate carrier technology. With a total of four patents to her name, she has made remarkable advancements that enhance the efficiency and accuracy of semiconductor manufacturing processes.

Latest Patents

Ami Sade's latest patents include an in-situ full wafer metrology system, which describes full wafer in-situ metrology chambers and methods of use. These metrology chambers feature a substrate support and a sensor bar that can rotate relative to each other. The sensor bar is equipped with multiple sensors positioned at different radii from a central axis. Another notable patent is for a substrate carrier apparatus that includes a hard mask. This apparatus features a carrier body with a support surface for the substrate and a mask assembly positioned above it. The mask assembly consists of an annular frame atop the support surface, with a hard mask that has openings arranged in a predetermined pattern.

Career Highlights

Ami Sade works at Applied Materials, Inc., a leading company in the semiconductor industry. Her work focuses on developing innovative solutions that improve manufacturing processes and product quality. With her expertise, she has played a crucial role in advancing technologies that are essential for modern electronics.

Collaborations

Ami collaborates with talented individuals in her field, including her coworkers Yair Eran and Gad Greenberg. These collaborations foster an environment of innovation and creativity, allowing for the development of cutting-edge technologies.

Conclusion

Ami Sade's contributions to the field of metrology and substrate carrier technology exemplify her dedication to innovation. Her patents reflect her commitment to enhancing semiconductor manufacturing processes, making her a valuable asset to the industry.