Amber Lynn Dagel

Title: Innovations of Amber Lynn Dagel

Introduction

Amber Lynn Dagel is a prominent inventor based in Albuquerque, NM (US). She has made significant contributions to the field of imaging technology, holding a total of 7 patents. Her work focuses on advanced methods and systems that enhance imaging capabilities.

Latest Patents

Among her latest patents is the "Speckle-based imaging diffuser and method for controllably fabricating same." This invention involves a mask designed for use in speckle-based x-ray or neutron phase contrast imaging systems. The mask can either absorb or alter the phase of the incident x-ray or neutron beam. It features consistent statistics across its surface, is locally unique to avoid ambiguous correlations, and has a speckle size that aligns with the imaging system's resolution. The mask's attributes are carefully controlled through the fabrication method and materials used. Another notable patent is the "Task-specific sensor optical designs." This invention outlines a method and system architecture for designing a compressive sensing matrix for machine learning. It includes generating a sensing matrix from an image associated with a classification task and mapping values from a prism array to a detector, which detects light refracted at an output angle determined by the prism's physical shape.

Career Highlights

Amber Lynn Dagel is currently employed at National Technology & Engineering Solutions of Sandia, LLC. Her role involves pioneering research and development in imaging technologies, contributing to advancements in the field.

Collaborations

She has collaborated with notable colleagues, including Gabriel Carlisle Birch and Charles Fredrick LaCasse, Iv. These partnerships have further enriched her innovative work and expanded the impact of her inventions.

Conclusion

Amber Lynn Dagel's contributions to imaging technology through her patents and collaborations highlight her role as a leading inventor in her field. Her innovative approaches continue to push the boundaries of what is possible in imaging systems.