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Essex Junction, VT, United States of America

Alvin Wayne Strong

This inventor holds 35 USPTO granted patents, primarily in Semiconductor Reliability. Top assignees: International Business Machines Corporation, Advanced Micro Devices Corporation, Globalfoundries Inc.. Active years: 1999-2016.

USPTO Granted Patents = 35

% Patents Active = 42.9

Average Co-Inventor Count = 3.3

ph-index = 8

Forward Citations = 280(Granted Patents)

Company Filing History:

34 out of 166,159

International Business Machines Corporation

patents

1 out of 13,146

Advanced Micro Devices Corporation

Siemens Aktiengesellschaft

patents

where one patent can have more than one assignee

Years Active: 1999-2016

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Areas of Expertise:

Semiconductor Device

Electrically Tunable Resistor

Thermal Antenna

Stress Testing

Charge Accumulation

Trench Capacitor

Soft Errors

IC Chip Reliability

Electromigration

Non-Volatile Memory

Dielectric Reliability

Thermo-Mechanical Structure

35 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9404960 - On chip bias temperature instability characterization of a semiconductor device (2016-08-02),

2. 8555216 - Structure for electrically tunable resistor (2013-10-08),

3. 8217671 - Parallel array architecture for constant current electro-migration stress testing (2012-07-10),

4. 8178434 - On-chip embedded thermal antenna for chip cooling (2012-05-15),

5. 8138573 - On-chip heater and methods for fabrication thereof and use thereof (2012-03-20),

6. 8120356 - Measurement methodology and array structure for statistical stress and test of reliabilty structures (2012-02-21),

7. 8053814 - On-chip embedded thermal antenna for chip cooling (2011-11-08),

8. 8035200 - Neutralization of trapped charge in a charge accumulation layer of a semiconductor structure (2011-10-11),

9. 8018017 - Thermo-mechanical cleavable structure (2011-09-13),

10. 7868640 - Array-based early threshold voltage recovery characterization measurement (2011-01-11),

11. 7791169 - Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors (2010-09-07),

12. 7736915 - Method for neutralizing trapped charge in a charge accumulation layer of a semiconductor structure (2010-06-15),

13. 7723200 - Electrically tunable resistor and related methods (2010-05-25),

14. 7704847 - On-chip heater and methods for fabrication thereof and use thereof (2010-04-27),

15. 7512506 - IC chip stress testing (2009-03-31),

Title: The Ingenious Innovations of Alvin Wayne Strong

Introduction:

Alvin Wayne Strong, a prolific inventor based in Essex Junction, VT (US), has made significant contributions to the field of semiconductor devices with an impressive portfolio of 35 patents.

Latest Patents:

Strong's latest patents showcase his expertise in semiconductor technology, including innovations such as "On chip bias temperature instability characterization of a semiconductor device" and "Structure for electrically tunable resistor."

Career Highlights:

Throughout his career, Strong has demonstrated a deep understanding of semiconductor design and manufacturing. He has worked with renowned companies such as IBM (International Business Machines Corporation) and Siemens Aktiengesellschaft, where he honed his skills and expertise.

Collaborations:

Strong has collaborated with esteemed professionals in the industry, including his coworkers John M Aitken and Ethan Harrison Cannon. Together, they have worked on projects aiming to push the boundaries of semiconductor innovation.

Conclusion:

Alvin Wayne Strong's innovative spirit and dedication to advancing semiconductor technology have solidified his reputation as a leading inventor in the field. His patents and collaborations underscore his commitment to excellence and ongoing contributions to the world of inventions and innovations.

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