The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Apr. 02, 2008
Kanak B Agarwal, Austin, TX (US);
Nazmul Habib, South Burlington, VT (US);
Jerry D. Hayes, Georgetown, TX (US);
John Greg Massey, Jericho, VT (US);
Alvin W. Strong, Essex Junction, VT (US);
Kanak B Agarwal, Austin, TX (US);
Nazmul Habib, South Burlington, VT (US);
Jerry D. Hayes, Georgetown, TX (US);
John Greg Massey, Jericho, VT (US);
Alvin W. Strong, Essex Junction, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and test circuit provide measurements to aid in the understanding of time-varying threshold voltage changes such as negative bias temperature instability and positive bias temperature instability. In order to provide accurate measurements during an early stage in the threshold variation, a current generating circuit is integrated on a substrate with the device under test, which may be a device selected from among an array of devices. The current generating circuit may be a current mirror that responds to an externally-supplied current provided by a test system. A voltage source circuit may be included to hold the drain-source voltage of the transistor constant, although not required. A stress is applied prior to the measurement phase, which may include a controllable relaxation period after the stress is removed.