The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
May. 31, 2007
Oliver Aubel, Dresden, DE;
Tom C. Lee, Essex Junction, VT (US);
Deborah M. Massey, Jericho, VT (US);
Travis S. Merrill, Rutland, VT (US);
Stanley W. Polchlopek, Shelburne, VT (US);
Alvin W. Strong, Essex Junction, VT (US);
Timothy D. Sullivan, Underhill, VT (US);
Oliver Aubel, Dresden, DE;
Tom C. Lee, Essex Junction, VT (US);
Deborah M. Massey, Jericho, VT (US);
Travis S. Merrill, Rutland, VT (US);
Stanley W. Polchlopek, Shelburne, VT (US);
Alvin W. Strong, Essex Junction, VT (US);
Timothy D. Sullivan, Underhill, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
Methods, systems and program products are disclosed for performing a stress test of a line in an integrated circuit (IC) chip. One embodiment of the method includes: applying a constant current Ito the line; and stress testing the line while applying the constant current Isuch that the constant current Iis not altered by a resistance change due to an onset of electromigration.