Shelburne, VT, United States of America

Stanley W Polchlopek


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2009

where 'Filed Patents' based on already Granted Patents

1 patent (USPTO):

Title: The Innovations of Stanley W. Polchlopek

Introduction

Stanley W. Polchlopek is a notable inventor based in Shelburne, Vermont. He has made significant contributions to the field of integrated circuit technology, particularly in stress testing methods for IC chips. His innovative approach has led to the development of a patented method that enhances the reliability of electronic components.

Latest Patents

Stanley W. Polchlopek holds a patent for his work on IC chip stress testing. The patent describes methods, systems, and program products for performing a stress test on a line in an integrated circuit (IC) chip. One embodiment of the method includes applying a constant current to the line and stress testing the line while ensuring that the constant current is not altered by resistance changes due to electromigration. This innovation is crucial for improving the durability and performance of IC chips.

Career Highlights

Throughout his career, Stanley has worked with prominent companies in the technology sector. He has been associated with International Business Machines Corporation (IBM) and Advanced Micro Devices Corporation (AMD). His experience in these leading organizations has allowed him to refine his skills and contribute to groundbreaking advancements in the field.

Collaborations

Some of Stanley's notable coworkers include Oliver Aubel and Tom C. Lee. Their collaboration has likely fostered an environment of innovation and creativity, leading to significant advancements in their respective projects.

Conclusion

Stanley W. Polchlopek's contributions to the field of integrated circuits through his patented methods for stress testing have made a lasting impact on technology. His work continues to influence the reliability and performance of electronic components in various applications.

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