Company Filing History:
Years Active: 2012
Title: Alpa Kohli: Innovator in Wafer Inspection Technologies
Introduction
Alpa Kohli is a notable inventor based in Saratoga, California. She has made significant contributions to the field of wafer inspection technologies. Her innovative work has led to the development of a patent that enhances the efficiency and effectiveness of inspection-related functions.
Latest Patents
Alpa Kohli holds a patent titled "Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions." This patent encompasses various systems and methods designed to create persistent data for a wafer. It also focuses on utilizing this persistent data for inspection-related functions. One of the key features of her patented system includes a set of processor nodes that are coupled to a detector of an inspection system. Each processor node is configured to receive a portion of image data generated by the detector during the scanning of a wafer. The system further includes an array of storage media that is separately coupled to each of the processor nodes. The processor nodes are designed to send all of the image data or a selected portion of the image data received to the arrays of storage media. This ensures that all of the image data generated during the scanning of the wafer is effectively stored.
Career Highlights
Alpa Kohli is currently employed at KLA-Tencor Corporation, a leading company in the semiconductor industry. Her role at the company allows her to work on cutting-edge technologies that are crucial for wafer inspection and quality assurance.
Collaborations
Alpa has collaborated with several talented individuals in her field, including Kris Bhaskar and Chetana Bhaskar. These collaborations have contributed to the advancement of technologies in wafer inspection.
Conclusion
Alpa Kohli's innovative contributions to wafer inspection technologies demonstrate her expertise and commitment to advancing the field. Her patent reflects her ability to create systems that enhance data management and inspection processes.