This inventor holds 2 USPTO granted patents. Top assignee: Nova Measuring Instruments Ltd.. Active years: 2017-2018.
Company Filing History:
Years Active: 2017-2018
Title: Alon Belleli: Innovator in Optical Inspection Technologies
Introduction
Alon Belleli is a prominent inventor based in Gedera, Israel. He has made significant contributions to the field of optical inspection technologies, particularly in the detection of defects in three-dimensional structures. With a total of 2 patents, Belleli's work is instrumental in advancing inspection systems used in semiconductor manufacturing.
Latest Patents
Belleli's latest patents include an "Optical method and system for defects detection in three-dimensional structures." This innovative inspection system is designed for structures with patterns formed by elongated grooves, such as semiconductor wafers. The system features an imaging component that utilizes a dark-field imaging scheme to generate images of the structure. The control unit analyzes pixel brightness in these images to identify defective grooves based on their brightness levels.
Another notable patent is the "Optical method and system for detecting defects in three-dimensional structures." This method focuses on inspecting via-containing structures by processing measured data that reflects the spectral response of these regions. By identifying changes in the spectral response parameters, the system can generate output data indicating potential defects at the inner surfaces of the vias.
Career Highlights
Alon Belleli is currently associated with Nova Measuring Instruments Ltd., a company known for its advanced measurement solutions in the semiconductor industry. His work at Nova has positioned him as a key player in the development of innovative inspection technologies.
Collaborations
Throughout his career, Belleli has collaborated with notable colleagues, including Gilad Barak and Elad Dotan. These partnerships have contributed to the successful development and implementation of his patented technologies.
Conclusion
Alon Belleli's contributions to optical inspection technologies have significantly impacted the semiconductor industry. His innovative patents and collaborations highlight his role as a leading inventor in this field.