Allan M Ryan

Title: Innovations of Allan M Ryan

Introduction

Allan M Ryan is a notable inventor based in Billerica, MA (US), recognized for his contributions to automatic test equipment. He holds three patents that showcase his innovative approach to enhancing testing procedures and equipment efficiency.

Latest Patents

One of his latest patents is titled "Easy to program automatic test equipment." This invention focuses on techniques for providing a test procedure for testing devices using automatic test equipment (ATE). The ATE system includes memory with a stored test application, a test interface for device connection, and a processor that operates according to the test application. This system allows users to create test procedures by combining test elements without needing extensive programming knowledge.

Another significant patent is "Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment." This patent discloses pin slice circuitry that combines CMOS and bipolar technologies. The CMOS portion includes timing generator circuits and digital signal processing circuitry, while the bipolar portion features driver/receiver channels and a parametric measurement unit. This innovative design reduces size and cost compared to conventional pin slice circuitry.

Career Highlights

Allan M Ryan is currently employed at Teradyne, Inc., where he continues to develop advanced testing solutions. His work has significantly impacted the field of automatic test equipment, making testing processes more accessible and efficient.

Collaborations

Throughout his career, Allan has collaborated with notable coworkers such as Ernest P Walker and Ronald A Sartschev, contributing to various innovative projects in the field.

Conclusion

Allan M Ryan's contributions to automatic test equipment through his patents demonstrate his commitment to innovation and efficiency in technology. His work continues to influence the industry and improve testing methodologies.