This inventor holds 1 USPTO granted patent. Top assignee: Mettler-Toledo Ag. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: Alfred Peer: Innovator in Measuring Technology
Introduction
Alfred Peer is a notable inventor based in Cham, Switzerland. He has made significant contributions to the field of measuring technology, particularly through his innovative patent that enhances the efficiency of measuring probes in process systems.
Latest Patents
Alfred Peer holds a patent for a "Method and device for determining the condition of a measuring probe." This exemplary method serves to determine the condition of at least one measuring probe integrated into a process vessel of a process system. The method allows for the cleaning of the measuring probe without the need for uninstallation, utilizing CIP and SIP processes. The temperature of the measuring probe or the surrounding medium can be measured by a sensor, and the condition of the probe can be assessed based on the recorded temperature over time during operation.
Career Highlights
Alfred Peer is associated with Mettler-Toledo AG, a company renowned for its precision instruments and measuring technology. His work at Mettler-Toledo AG has positioned him as a key player in advancing measurement solutions.
Collaborations
Alfred has collaborated with notable colleagues, including Jürgen Ammann and René Oberlin, contributing to the development of innovative solutions in the field.
Conclusion
Alfred Peer's contributions to measuring technology through his patent and work at Mettler-Toledo AG highlight his role as an influential inventor. His innovative methods continue to enhance the efficiency and reliability of measuring probes in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile