The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
Dec. 22, 2004
Jürgen Ammann, Zürich, CH;
Alfred Peer, Cham, CH;
René Oberlin, Würrenlos, CH;
Klaus-dieter Anders, Oberrohrdorf, CH;
Christian Zwicky, Gockhausen, CH;
Jürgen Ammann, Zürich, CH;
Alfred Peer, Cham, CH;
René Oberlin, Würrenlos, CH;
Klaus-Dieter Anders, Oberrohrdorf, CH;
Christian Zwicky, Gockhausen, CH;
Mettler-Toledo AG, Greifensee, CH;
Abstract
An exemplary method is disclosed which serves to determine a condition of at least one measuring probe which is integrated in a process vessel of a process system with one or more system stages and which is cleaned from time to time using, for example, CIP- and SIP processes, without uninstalling the measuring probe for the cleaning. The temperature of the measuring probe or of the medium surrounding the measuring probe can be measured by a measuring sensor arranged inside or outside the measuring probe, and the condition of the measuring probe can be determined based on a record of the temperature (T) measured over the time when the measuring probe is in operation. In some cases, the method can include monitoring correct execution of the CIP- and SIP processes.