Mettler-toledo Ag

Alfred Peer

Klaus-Dieter Anders

Jürgen Ammann

Christian Zwicky

René Oberlin

An exemplary method is disclosed which serves to determine a condition of at least one measuring probe which is integrated in a process vessel of a process system with one or more system stages and which is cleaned from time to time using, for example, CIP- and SIP processes, without uninstalling the measuring probe for the cleaning. The temperature of the measuring probe or of the medium surrounding the measuring probe can be measured by a measuring sensor arranged inside or outside the measuring probe, and the condition of the measuring probe can be determined based on a record of the temperature (T) measured over the time when the measuring probe is in operation. In some cases, the method can include monitoring correct execution of the CIP- and SIP processes.

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Cham, Switzerland

Alfred Peer