Berlin, Germany

Albrecht Kruger


Average Co-Inventor Count = 4.8

ph-index = 2

Forward Citations = 19(Granted Patents)


Company Filing History:


Years Active: 1996-2005

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2 patents (USPTO):Explore Patents

Title: Albrecht Kruger: Innovator in Spectroscopic Ellipsometry

Introduction

Albrecht Kruger is a notable inventor based in Berlin, Germany. He has made significant contributions to the field of optical measurement technology, particularly through his innovative patents in spectroscopic ellipsometry. With a total of 2 patents, Kruger has demonstrated his expertise and commitment to advancing scientific instrumentation.

Latest Patents

One of Kruger's latest inventions is an ellipsometer designed for the examination of samples. This ellipsometer features a broadband light source on the emitter side and a detector on the receiver side, which captures the light beam reflected from the sample. It includes a refractive optic that generates a precisely defined measuring spot on the sample, along with an aperture on the emitter side for further definition. This invention simplifies the process of producing a defined measuring spot, enhancing the accuracy of measurements.

Another significant patent involves a method for determining characteristic values of transparent layers in the nanometer range. This method allows for the determination of layer thickness and refractive index using a spectro-ellipsometer. The invention aims to achieve accurate measurements even with a less complex ellipsometer that operates at one or a few wavelengths. By measuring ellipsometric angles and the wavelength-dependent reflection of the probe, Kruger’s method provides a reliable way to determine spectral dependencies of characteristic values.

Career Highlights

Albrecht Kruger is associated with Sentech Instruments GmbH, a company known for its innovative solutions in optical measurement technology. His work at Sentech has positioned him as a key player in the development of advanced ellipsometric techniques.

Collaborations

Kruger has collaborated with notable colleagues, including Uwe Wielsch and Uwe Richter. Their combined expertise has contributed to the advancement of technologies in the field of optical measurements.

Conclusion

Albrecht Kruger is a distinguished inventor whose work in spectroscopic ellipsometry has made a significant impact on optical measurement technology. His innovative patents and contributions to Sentech Instruments GmbH highlight his dedication to advancing scientific instrumentation.

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