Alan Davila

Title: Alan Davila: Innovator in Metrology Guided Inspection

Introduction

Alan Davila is a notable inventor based in El Paso, Texas. He has made significant contributions to the field of metrology guided inspection through his innovative patent. His work focuses on improving processes related to specimen analysis, which is crucial in various technological applications.

Latest Patents

Alan Davila holds a patent titled "Wafer signature local maxima via clustering for metrology guided inspection." This patent outlines methods and systems for generating information that aids in setting up processes performed on a specimen. One of the key methods involves clustering dies on a specimen based on colors assigned to the dies, which are responsive to predicted defect densities determined from measurements on the specimen. The process includes analyzing initial die clusters to identify those that contain two or more die clusters, ultimately designating final die clusters for further use in process setup.

Career Highlights

Alan Davila is currently employed at Kla Corporation, where he applies his expertise in metrology and inspection technologies. His innovative approach has contributed to advancements in the field, enhancing the efficiency and accuracy of inspection processes.

Collaborations

Some of Alan's coworkers include Marcus Liesching and Sandeep Bhagwat, who collaborate with him on various projects at Kla Corporation. Their combined efforts contribute to the development of cutting-edge technologies in the industry.

Conclusion

Alan Davila's work exemplifies the importance of innovation in metrology guided inspection. His patent and contributions to Kla Corporation highlight his role as a key figure in advancing technology in this field.