Akishima, Japan

Akito Sasaki


 

Average Co-Inventor Count = 4.1

ph-index = 1

Forward Citations = 8(Granted Patents)


Location History:

  • Tokyo, JP (2006 - 2015)
  • Akishima, JP (2010 - 2020)

Company Filing History:


Years Active: 2006-2020

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4 patents (USPTO):Explore Patents

Title: Akito Sasaki: Innovator in X-ray Diffraction Measurement

Introduction

Akito Sasaki is a prominent inventor based in Akishima, Japan. He has made significant contributions to the field of X-ray diffraction measurement, holding a total of 4 patents. His work focuses on improving the methods of displaying and analyzing measurement results from X-ray diffraction.

Latest Patents

One of his latest patents is a method for displaying measurement results from X-ray diffraction measurement. This method involves irradiating a sample with X-rays and detecting the diffracted X-rays using an X-ray detector. The process includes forming a one-dimensional diffraction profile and a two-dimensional diffraction pattern, ensuring that both are aligned for accurate analysis. Another notable patent is an analysis method for X-ray diffraction measurement data. This method determines peak positions and integrated intensities of diffraction X-rays, allowing for qualitative and quantitative analysis of materials contained in a measurement sample.

Career Highlights

Akito Sasaki is currently employed at Rigaku Corporation, a company known for its advancements in X-ray analysis and measurement technologies. His innovative approaches have contributed to the company's reputation as a leader in the field.

Collaborations

Throughout his career, Akito has collaborated with notable colleagues such as Keiichi Morikawa and Akihiro Himeda. These collaborations have further enhanced the development of advanced measurement techniques in X-ray diffraction.

Conclusion

Akito Sasaki's contributions to X-ray diffraction measurement have established him as a key figure in the field. His innovative patents and collaborations continue to influence advancements in measurement technologies.

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