The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2010
Filed:
Jul. 23, 2007
Akito Sasaki, Akishima, JP;
Aya Kuribayashi, Akishima, JP;
Keiichi Morikawa, Fuchu, JP;
Kunio Nishi, Hachioji, JP;
Takao Ohara, Higashimurayama, JP;
Toshiyuki Kato, Akishima, JP;
Yuji Tsuji, Hamura, JP;
Akito Sasaki, Akishima, JP;
Aya Kuribayashi, Akishima, JP;
Keiichi Morikawa, Fuchu, JP;
Kunio Nishi, Hachioji, JP;
Takao Ohara, Higashimurayama, JP;
Toshiyuki Kato, Akishima, JP;
Yuji Tsuji, Hamura, JP;
Rigaku Corporation, Tokyo, JP;
Abstract
An X-ray analysis apparatus has information about a relationship between selection of a measurement type and a replacement work of optical parts and shows, on a screen of a display, graphical information about optical parts which should be changed, to make it easy for an operator to perform a preliminary work before measurement. When the operator selects one desired measurement type among a plurality of measurement types in a selection window, there is displayed on the display, depending on the selected measurement type, graphical information about necessary optical parts which should be newly installed and/or installed optical parts which should be removed. The operator looks at the operating instructions and then performs the replacement work. The graphical information may be: graphical indication of the installation locations of the optical parts; different pictorial expressions about the installation and the removal works; and graphical indication of the identification marks of the optical parts.