Mishima, Japan

Akira Shigekawa

This inventor holds 3 USPTO granted patents and 1 EPO patent. Top assignee: Hitachi Metals, Ltd.. Active years: 2015-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akira Shigekawa. Retrieved from https://idiyas.com/inventor/akira-shigekawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.8

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2015-2018

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3 patents (USPTO):Explore Patents

Title: Akira Shigekawa: Innovator in Radiation Detection Technology

Introduction

Akira Shigekawa is a notable inventor based in Mishima-gun, Japan. He has made significant contributions to the field of radiation detection technology, holding a total of 3 patents. His work focuses on innovative methods for producing scintillator arrays and radiation detectors.

Latest Patents

Shigekawa's latest patents include a "Production method of scintillator dual array" and a "Method for producing radiation detector." The production method involves bonding scintillator bar arrays with different sensitivity distributions and cutting them to create a functional array. The radiation detector production method outlines the creation of cell arrays with varying compositions to enhance detection sensitivity, utilizing reflective layers and light-receiving elements.

Career Highlights

Akira Shigekawa is currently employed at Hitachi Metals, Ltd., where he continues to develop advanced technologies in radiation detection. His innovative approaches have positioned him as a key figure in his field, contributing to the advancement of detection methods.

Collaborations

Shigekawa has collaborated with notable coworkers, including Hideo Nitta and Satoshi Shiota, who have also contributed to the development of technologies in the same domain.

Conclusion

Akira Shigekawa's work in radiation detection technology exemplifies innovation and dedication. His patents reflect a commitment to improving detection methods, making significant strides in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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