Garland, TX, United States of America

Adolfo Anciso


Average Co-Inventor Count = 2.4

ph-index = 1

Forward Citations = 4(Granted Patents)


Location History:

  • Richardson, TX (US) (2005)
  • Garland, TX (US) (2004 - 2007)

Company Filing History:


Years Active: 2004-2007

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4 patents (USPTO):Explore Patents

Title: Adolfo Anciso: Innovator in Microelectronics Imaging

Introduction

Adolfo Anciso is a notable inventor based in Garland, TX (US), recognized for his contributions to the field of microelectronics. With a total of 4 patents to his name, Anciso has made significant advancements in imaging techniques for microelectronics devices.

Latest Patents

Among his latest patents, Anciso has developed a "Chemical etch solution and technique for imaging a device's shallow junction profile." This invention provides a method for imaging microelectronics devices by cleaning samples with a specific solution and producing images that highlight contrasts between different regions within the sample. Another notable patent is the "Site-specific method for large area uniform thickness plan view transmission electron microscopy sample preparation," which involves separating substrate portions and utilizing focused ion beam milling for sample preparation.

Career Highlights

Adolfo Anciso is currently employed at Texas Instruments Corporation, where he applies his expertise in microelectronics. His work has contributed to the development of innovative imaging techniques that enhance the understanding of microelectronic devices.

Collaborations

Throughout his career, Anciso has collaborated with esteemed colleagues, including Lancy Y Tsung and Patrick J Jones, further enriching his contributions to the field.

Conclusion

Adolfo Anciso's innovative work in microelectronics imaging has established him as a key figure in the industry. His patents reflect a commitment to advancing technology and improving imaging techniques for microelectronics devices.

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