The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2007

Filed:

Jan. 04, 2005
Applicants:

Lancy Y. Tsung, Plano, TX (US);

Adolfo Anciso, Garland, TX (US);

Doug Matheson, Allen, TX (US);

Inventors:

Lancy Y. Tsung, Plano, TX (US);

Adolfo Anciso, Garland, TX (US);

Doug Matheson, Allen, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides, in one aspect, a method of imaging a microelectronics device. The method comprises cleaning, when contaminants are preset, a sample of a microelectronics deviceto be imaged with a first solution comprising hydrofluoric acid, an inorganic acid and water, exposing the sample to a second solution comprising hydrofluoric acid, an inorganic acid and an organic acid, wherein the second solution forms a contrast between different regions within the sample, and producing an image of the contrasted sample.


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