Achim Göhl

Title: Achim Göhl: Innovator in Electron Beam Technology

Introduction

Achim Göhl is a notable inventor based in Heimstetten, Germany. He has made significant contributions to the field of electron beam technology, particularly with his innovative patent that enhances the capabilities of electron beam devices.

Latest Patents

Achim Göhl holds a patent for a Multiple Electron Beam Device. This invention provides a sophisticated method for probing or structuring non-transparent specimens using an array of electron beam sources. The device generates multiple primary electron beams and includes an electron sensor designed to detect these beams. The sensor also plays a crucial role in inspecting the beams, calibrating their positions, and adjusting the final focus length and currents before or after probing the specimen's surface. This technology represents a significant advancement in the field, offering improved methods for electron beam inspection and calibration.

Career Highlights

Achim Göhl is associated with Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh, where he applies his expertise in semiconductor testing and electron beam technology. His work has been instrumental in developing advanced testing methodologies that enhance the reliability and performance of electronic components.

Collaborations

Achim has collaborated with notable colleagues in his field, including Dieter Winkler and Pavel Adamec. These partnerships have fostered innovation and contributed to the advancement of electron beam technology.

Conclusion

Achim Göhl's contributions to electron beam technology through his patent and collaborative efforts highlight his role as a key innovator in the field. His work continues to influence advancements in semiconductor testing and electron beam applications.