Plano, TX, United States of America

Aaron Michael Dangerfield

This inventor holds 1 USPTO granted patent and 3 published patent applications and 1 EPO patent. Top assignees: The University of Texas System, Versum Materials US, LLC. Active years: 2024.

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Aaron Michael Dangerfield

Introduction

Aaron Michael Dangerfield is an accomplished inventor based in Plano, Texas. He holds a patent that showcases his expertise in the field of materials science, particularly in the deposition of silicon nitride films. His innovative methods contribute significantly to advancements in semiconductor technology.

Latest Patents

Aaron Michael Dangerfield's notable patent is titled "Methods for depositing a conformal metal or metalloid silicon nitride film." This patent describes methods for forming a conformal Group 4, 5, 6, 13 metal or metalloid doped silicon nitride film. The process involves several steps, including providing a substrate in a reactor, introducing aluminum precursors, purging the reactor, and reacting organoaminosilane precursors to achieve the desired film thickness.

Career Highlights

Throughout his career, Aaron has worked with reputable organizations such as Versum Materials and the University of Texas System. His experience in these institutions has allowed him to refine his skills and contribute to significant research and development projects.

Collaborations

Aaron has collaborated with notable colleagues, including Xinjian Lei and Moo-Sung Kim. These partnerships have fostered a collaborative environment that enhances innovation and research outcomes.

Conclusion

Aaron Michael Dangerfield's contributions to the field of materials science through his patent and career experiences highlight his role as a significant inventor. His work continues to influence advancements in technology and materials engineering.

Profile summary based on public USPTO records.
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