Danderyd, Sweden

Xcounter Ab


USPTO Granted Patents = 47

% Expired Patents = 21.3



Forward Citations = 298

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10 inventors (with patents filed for the assignee):

goldMedal Tom Francke (37 out of 43 patents)

silverMedal Christer Ullberg (17 out of 22 patents)

bronzeMedal Vladimir Peskov (10 out of 12 patents)

4.  Skiff Sokolov (6 out of 6 patents)

5.  Juha Rantanen (4 out of 4 patents)

6.  Stefan Thunberg (2 out of 2 patents)

7.  Mattias Urech (1 out of 1 patent)

8.  Niclas Weber (1 out of 1 patent)

9.  Tomas Kristoffersson (1 out of 1 patent)

10.  Peter Svedenhag (1 out of 1 patent)

11.  Vladimir Peskov (0 patent)

12.  Skiff Sokolov (0 patent)


Core Competencies:
Radiation Detector
Computed Tomography
Imaging System
X-ray Imaging
Tomosynthesis
Noise Reduction
Dual-energy Scanning
Collimator
Ionizing Radiation
Radiography
Gaseous-based Detector
Exposure Control

47 patents:

Company Overview
Xcounter Ab, based in Danderyd, Sweden, specializes in advanced radiation detection technologies. The company focuses on developing innovative solutions in computed tomography, X-ray imaging, and tomosynthesis, enhancing diagnostic capabilities in medical imaging. Their expertise extends to dual-energy scanning and coherent scatter imaging, utilizing gaseous-based detectors and noise reduction techniques to improve image quality and patient safety. Xcounter Ab is committed to advancing healthcare through cutting-edge imaging technologies.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

Xcounter Ab USPTO Patent Assignee Logo
47 Patents

#3 in Danderyd

#146 in Sweden

#14,821 in the World

Danderyd, SE
Danderyd, Sweden
Forward Citations = 298

10 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Xcounter Ab. Retrieved from https://idiyas.com/company/xcounter-ab

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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