The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Oct. 12, 2007
Applicants:

Tom Francke, Sollentuna, SE;

Christer Ullberg, Sollentuna, SE;

Inventors:

Tom Francke, Sollentuna, SE;

Christer Ullberg, Sollentuna, SE;

Assignee:

Xcounter AB, Daneryd, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for creating, displaying, and analyzing X-ray images of a plurality of objects is disclosed. The method comprising, for each of the objects recording three-dimensional X-ray image data of the object in a single measurement; creating a three-dimensional X-ray image of the object from the three-dimensional X-ray image data; creating one or two two-dimensional X-ray images of the object from the three-dimensional X-ray image data; displaying the one or two two-dimensional X-ray images of the object; and analyzing the one or two two-dimensional X-ray images of the object. For a subset of the plurality of objects the three-dimensional X-ray image of the object is displayed, wherein the subset of the plurality of objects is determined based on the step of, for each of the objects, analyzing the one or two two-dimensional X-ray images of the object.


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