% Expired Patents = 33.3

EPO Patents = 1

Forward Citations = 25

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7 inventors (with patents filed for the assignee):

Ralph W Gerchberg (3 out of 5 patents)

Rolf Gerchberg (3 out of 3 patents)

Robert W Gray (2 out of 52 patents)

4. Michael L Weiner (2 out of 38 patents)

5. David F Prelewitz (2 out of 5 patents)

6. Louise Gerchberg, Legal Representative (1 out of 1 patent)

7. Thomas Dean Milster (1 out of 19 patents)

6 patents: Sort by Forward Citations

1. 12282116 - Machine vision method and system (2025-04-21),

2. 8941914 - Light microscope with novel digital method to achieve super-resolution (2015-01-27),

3. 8040595 - Light microscope with novel digital method to achieve super-resolution (2011-10-18),

4. 7470903 - Digital imaging assembly & methods thereof (2008-12-30),

5. 7282716 - Digital imaging assembly and methods thereof (2007-10-16),

6. 6369932 - System and method for recovering phase information of a wave front (2002-04-09),

Company Overview

Wavefront Analysis, Inc. is a leading provider of advanced wavefront technology solutions for various industries. Our innovative products and services help clients optimize optical systems and improve overall performance. With a team of experienced engineers and cutting-edge technology, we deliver customized solutions to meet the unique needs of our clients. Visit our website to learn more about our products and services.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

6 Patents

#9 in Ardsley, NY

#2,697 in New York

#45,007 in US

Ardsley, NY, United States of America

Wavefront Analysis, Inc.

Forward Citations = 25

7 inventors:

Ralph W Gerchberg (3 out of 5 patents)

Rolf Gerchberg (3 out of 3 patents)

Robert W Gray (2 out of 52 patents)

4. Michael L Weiner (2 out of 38 patents)

5. David F Prelewitz (2 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Wavefront Analysis, Inc.. Retrieved from https://idiyas.com/company/wavefront-analysis

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]