The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2008
Filed:
Nov. 16, 2007
David F. Prelewitz, Rochester, NY (US);
Robert W. Gray, Rochester, NY (US);
Rolf Gerchberg, Long Meadow, MA (US);
Michael L. Weiner, Webster, NY (US);
David F. Prelewitz, Rochester, NY (US);
Robert W. Gray, Rochester, NY (US);
Rolf Gerchberg, Long Meadow, MA (US);
Michael L. Weiner, Webster, NY (US);
Technology Innovations, LLC, Pittsford, NY (US);
Wavefront Analysis, Ardsley, NY (US);
Abstract
A coherent radiation imaging system that produces digital images with a reduced amount of speckle. Radiation from a long coherence length source is used to form an image of a sample. The output coherent wave is temporally divided into a plurality of wavelets. The spatial phase of each wavelet is then modulated a known and different amount. Each phase modulated wavelet illuminates the sample and is perturbed by its interaction with the sample. A spatial phase map of each perturbed wavelet is then created and converted to a sample image with an image reconstruction program. The plurality of sample images thus formed is statistically averaged to form a final averaged image. The high frequency speckle that is not optically resolvable tends to average to zero with continual statistical averaging, leaving only the optically resolvable lower frequency phase information.