The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Apr. 04, 2019
Wavefront Analysis, Inc., New York, NY (US);
Rolf Jon Gerchberg, Longmeadow, MA (US);
Thomas Dean Milster, Tucson, AZ (US);
Wavefront Analysis, Inc., New York, NY (US);
Abstract
An optical system for automated vision and detection. The system includes a light source configured to emit a beam into an environment and a first diffractive optical element. The beam passes through the first diffractive optical element, resulting in a plurality of beams. One or more of the plurality of beams are reflected by the environment, resulting in reflected beams. A second diffractive optical element of the optical system is configured to receive the reflected beams. A detector in alignment with the second diffractive optical element receives the reflected beams. The detector is configured to determine wave data from the reflected beams and generate a plurality of phasorgrams in a single image representing the wave data. The optical system also includes a processor configured to receive the single image and generate a representation of the environment. A control computer is configured to receive the representation of the environment from the processor.