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Tortola, Virgin Islands, British

Visuray Intech Ltd (Bvi)

USPTO Granted Patents = 20

Forward Citations = 10

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15 inventors (with patents filed for the assignee):

Philip Teague (17 out of 21 patents)

Melissa Spannuth (7 out of 9 patents)

Alex Stewart (4 out of 9 patents)

4. David Ponce (2 out of 3 patents)

5. Ådne Voll (2 out of 4 patents)

6. Dimitrios Pirovolou (1 out of 1 patent)

7. Mauro Arrambide (1 out of 1 patent)

8. Long Yu (1 out of 1 patent)

9. Andrii Sofiienko (1 out of 2 patents)

10. Henning Torsteinsen (1 out of 2 patents)

11. Morteza Esmaeili (1 out of 1 patent)

12. Spencer Gunn (1 out of 3 patents)

13. Pascal Ponard (1 out of 1 patent)

14. Payel Ghosh (1 out of 1 patent)

15. Robert Sloan (1 out of 1 patent)

20 patents: Sort by Forward Citations

1. 12517276 - Method for combining the results of ultrasound and x-ray and neutron cement evaluation logs through modality merging (2026-01-06),

2. 12372682 - Near-field sensitivity of formation and cement porosity measurements with radial resolution in a borehole (2025-07-29),

3. 12313809 - Non-invaded formation density measurement and photoelectric evaluation using an x-ray source (2025-05-27),

4. 12312938 - Methods and means for measuring multiple casing wall thicknesses using x-ray radiation in a wellbore environment (2025-05-27),

5. 11892591 - Method for predicting cased wellbore characteristics using machine learning (2024-02-06),

6. 11749490 - Method for reducing the diameter of a x-ray tube through recessing of the vacuum port (2023-09-05),

7. 11542808 - Methods and means for determining the existence of cement debonding within a cased borehole using x-ray techniques (2023-01-03),

8. 11275195 - Methods and means for azimuthal neutron porosity imaging of formation and cement volumes surrounding a borehole (2022-03-15),

9. 11158480 - Combined thermal and voltage transfer system for an x-ray source (2021-10-26),

10. 11041379 - Methods and means for casing, perforation and sand-screen evaluation using backscattered x-ray radiation in a wellbore environment (2021-06-22),

11. 11035978 - Methods and means for evaluating and monitoring formation creep and shale barriers using ionizing radiation (2021-06-15),

12. 11035220 - Methods and means for casing integrity evaluation using backscattered x-ray radiation in a wellbore environment (2021-06-15),

13. 10842007 - Method for proactive mitigation of coronal discharge and flash-over events within high voltage x-ray generators used in borehole logging (2020-11-17),

14. 10705247 - Methods and means for fracture mapping in a well bore (2020-07-07),

15. 10677958 - Resolution of detection of an azimuthal distribution of materials in multi-casing wellbore environments (2020-06-09),

Company Overview

Visuray Intech Ltd, based in Tortola, VG, specializes in advanced imaging technologies, primarily focusing on non-destructive testing solutions. The company develops innovative systems that enhance inspection processes across various industries, including oil and gas, construction, and manufacturing. By leveraging cutting-edge technology, Visuray aims to improve safety and efficiency in asset management and maintenance, contributing to the overall integrity of critical infrastructure. Their expertise positions them as a key player in the field of industrial inspection.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

20 Patents

#31 in Tortola

#39 in Virgin Islands, British

#31,264 in the World

Tortola, Virgin Islands, British

Visuray Intech Ltd (Bvi)

Forward Citations = 10

15 inventors:

Philip Teague (17 out of 21 patents)

Melissa Spannuth (7 out of 9 patents)

Alex Stewart (4 out of 9 patents)

4. David Ponce (2 out of 3 patents)

5. Ådne Voll (2 out of 4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Visuray Intech Ltd (Bvi). Retrieved from https://idiyas.com/company/visuray-intech-ltd-bvi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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