The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

May. 03, 2019
Applicants:

Philip Teague, Spring, TX (US);

Melissa Spannuth, Houston, TX (US);

Dimitrios Pirovolou, Katy, TX (US);

Inventors:

Philip Teague, Spring, TX (US);

Melissa Spannuth, Houston, TX (US);

Dimitrios Pirovolou, Katy, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/00 (2006.01); G01V 5/12 (2006.01); G01V 5/04 (2006.01);
U.S. Cl.
CPC ...
G01V 5/12 (2013.01); G01V 5/045 (2013.01);
Abstract

An x-ray-based reservoir evaluation tool for the measurement of the shale density anticipated at shale-creep barrier within a cased borehole is disclosed, wherein the tool includes an internal length comprising a sonde section, wherein the sonde section further includes an x-ray source; a plurality of radiation measuring detectors; sonde-dependent electronics; and a plurality of tool logic electronics and PSUs. A method of using an x-ray-based shale-seal evaluation tool for measuring the shale density anticipated at shale-creep barrier within a cased borehole is also disclosed, the method including: using x-rays to illuminate the formation surrounding the cased borehole; using detectors to directly measure the density of the formation; using detectors to directly measure the effects on the measurement from tool stand-off or production liner attenuation; and compensating for the production liner and liner-annular region when computing the saturated formation density within the production interval.


Find Patent Forward Citations

Loading…