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For the Inventor, By the Inventor

Kagawa, Japan

Vienex Corporation


USPTO Granted Patents = 5


Forward Citations = 0

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8 inventors (with patents filed for the assignee):

goldMedal Osamu Iwasaki (3 out of 3 patents)

silverMedal Kazuaki Ryuman (2 out of 2 patents)

bronzeMedal Akira Bogaki (1 out of 9 patents)

4.  Yasutoshi Hayashi (1 out of 1 patent)

5.  Masashi Nishikawa (1 out of 3 patents)

6.  Yukihiro Kagawa (1 out of 1 patent)

7.  Yukihiro Kagawa (1 out of 1 patent)

8.  Ryuta Watanabe (1 out of 1 patent)

9.  Motoari Shoji (2 patents)

10.  Tsutomu Nanao (6 patents)

11.  Yukihiro Kagawa (0 patent)

12.  Kenchu Baku (0 patent)

13.  Shinsuke Higuchi (0 patent)

14.  Satoru Murakami (0 patent)


5 patents:

1. 12541096 - Optical line sensor (2026-02-03),
2. 12292386 - Foreign substance/defect inspection device, image generation device in foreign substance/defect inspection, and foreign substance/defect inspection method (2025-05-06),
3. 12209971 - Foreign substance/defect inspection device, image generation device in foreign substance/defect inspection, and foreign substance/defect inspection method (2025-01-28),
4. 11882254 - Optical line sensor with pair of holding members separably attached at ends of illumination and light receiving units (2024-01-23),
5. 11375078 - Optical linear sensor unit (2022-06-28),
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USPTO Data Jan 1 1976 - Oct 6 2026

5 Patents

#16 in Kagawa

#6,651 in Japan

Kagawa, JP
Kagawa, Japan

Vienex Corporation

Forward Citations = 0

8 inventors:

goldMedal Osamu Iwasaki (3 out of 3 patents)

silverMedal Kazuaki Ryuman (2 out of 2 patents)

bronzeMedal Akira Bogaki (1 out of 9 patents)

4.  Yasutoshi Hayashi (1 out of 1 patent)

5.  Masashi Nishikawa (1 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Vienex Corporation. Retrieved from https://idiyas.com/company/vienex

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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