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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12209971 B1

PDFFull Text
Date of Patent:
Jan. 28, 2025

Filed:

Jun. 15, 2021

Foreign substance/defect inspection device, image generation device in foreign substance/defect inspection, and foreign substance/defect inspection method

Applicant:

Vienex Corporation, Kanoji, JP;

Inventors:

Osamu Iwasaki, Kanoji, JP;

Yukihiro Kagawa, Kanoji, JP;

Assignee:

VIENEX CORPORATION, Kagawa, JP;

Attorneys:

Andrew F. Young, ESQ.

NOLTE LACKENBACH SIEGEL

Primary Examiner:

Jared Walker

Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/94 (2006.01); H04N 23/56 (2023.01); H04N 25/701 (2023.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/94 (2013.01); H04N 23/56 (2023.01); H04N 25/701 (2023.01); G01N 2201/0633 (2013.01); G01N 2201/0826 (2013.01);
Abstract

One pixel unit including at least one light receiving element of a light receiving element array (photodiode array) and a light source have a one-to-one correspondence, and only when the light source emits light, the light beam is detected by at least one light receiving element (one pixel unit) corresponding to the light source. An illumination optical system includes a light guiding means for guiding to an inspection object by reducing an interval between optical axes of light beams emitted from a plurality of light sources in an arrangement direction of a plurality of the light sources.

Find Patent Forward Citations

Iwasaki, Osamu. (2025). Foreign substance/defect inspection device, image generation device in foreign substance/defect inspection, and foreign substance/defect inspection method (U.S. Patent No. 12209971). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12209971

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