For the Inventor, By the Inventor

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Carrollton, TX, United States of America

Verity Instruments, Inc.

USPTO Granted Patents = 32

EPO Patents = 1

Trademarks = 1

Forward Citations = 389

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30 inventors (with patents filed for the assignee):

Mark Anthony Meloni (13 out of 27 patents)

Andrew Weeks Kueny (12 out of 14 patents)

Mike Whelan (11 out of 13 patents)

4. John D Corless (10 out of 10 patents)

5. Kenneth C Harvey (5 out of 10 patents)

6. Larry Arlos Bullock (5 out of 5 patents)

7. Arun Ananth Aiyer (4 out of 23 patents)

8. Sean Lynes (2 out of 2 patents)

9. Richard J Daignault, Jr (2 out of 2 patents)

10. Jimmy W Hosch (2 out of 4 patents)

11. Cesar Alfaro (2 out of 2 patents)

12. David Buice (2 out of 2 patents)

13. Chris D Pylant (2 out of 2 patents)

14. Zhiyong Gu (1 out of 1 patent)

15. Hong Chen (1 out of 1 patent)

32 patents: Sort by Forward Citations

1. 12449622 - Fiberoptical cable assemblies and interfaces for spectrometers (2025-10-21),

2. 12174071 - System, apparatus, and method for improved background correction and calibration of optical devices (2024-12-24),

3. 11885682 - System, apparatus, and method for spectral filtering (2024-01-30),

4. 11725985 - Signal conversion system for optical sensors (2023-08-15),

5. 11424115 - Multimode configurable spectrometer (2022-08-23),

6. 10923324 - Microwave plasma source (2021-02-16),

7. 10861755 - System and method for measurement of complex structures (2020-12-08),

8. 10794763 - Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer (2020-10-06),

9. 10763144 - Adaptable-modular optical sensor based process control system, and method of operation thereof (2020-09-01),

10. 10679832 - Microwave plasma source (2020-06-09),

11. 10365212 - System and method for calibration of optical signals in semiconductor process systems (2019-07-30),

12. 9997325 - Electron beam exciter for use in chemical analysis in processing systems (2018-06-12),

13. 9842726 - Method and apparatus for the detection of arc events during the plasma processing of a wafer, surface of substrate (2017-12-12),

14. 9801265 - High dynamic range measurement system for process monitoring (2017-10-24),

15. 9772226 - Referenced and stabilized optical measurement system (2017-09-26),

Verity Instruments, Inc. is a leading manufacturer of high-quality scientific instruments and equipment. With a commitment to providing precise and reliable solutions, we serve a wide range of industries including research laboratories, pharmaceuticals, biotechnology, and more. Our advanced and innovative instruments help scientists and researchers in their quest for knowledge and technological advancements. Visit our website to learn more about our products and explore how Verity Instruments can enhance your scientific endeavors.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 2 2025

32 Patents

#5 in Carrollton, TX

#578 in Texas

#10,226 in US

#20,043 in the World

Carrollton, TX, United States of America

Verity Instruments, Inc.

Forward Citations = 389

30 inventors:

Mark Anthony Meloni (13 out of 27 patents)

Andrew Weeks Kueny (12 out of 14 patents)

Mike Whelan (11 out of 13 patents)

4. John D Corless (10 out of 10 patents)

5. Kenneth C Harvey (5 out of 10 patents)

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