For the Inventor, By the Inventor

Enter assignee name

Carrollton, TX, United States of America

Verity Instruments, Inc.

USPTO Granted Patents = 34

% Expired Patents = 2.9

EPO Patents = 1

Trademarks = 1

Forward Citations = 422

Loading Chart...

Loading Chart...

30 inventors (with patents filed for the assignee):

Mark Anthony Meloni (14 out of 28 patents)

Andrew Weeks Kueny (13 out of 15 patents)

Mike Whelan (12 out of 14 patents)

4. John D Corless (11 out of 11 patents)

5. Larry Arlos Bullock (6 out of 6 patents)

6. Kenneth C Harvey (5 out of 10 patents)

7. Arun Ananth Aiyer (4 out of 23 patents)

8. Richard J Daignault, Jr (3 out of 3 patents)

9. Sean Lynes (2 out of 2 patents)

10. Jimmy W Hosch (2 out of 4 patents)

11. Cesar Alfaro (2 out of 2 patents)

12. David Buice (2 out of 2 patents)

13. Chris D Pylant (2 out of 2 patents)

14. Zhiyong Gu (1 out of 1 patent)

15. Hong Chen (1 out of 1 patent)

Core Competencies:

Spectrometer

Optical Sensor

Microwave Plasma Source

Fiberoptical Cable

Charge Coupled Device

Dynamic Range

Calibration

Profilometer

Ellipsometer

Transducer

Process Monitoring

Film Thickness

34 patents: Sort by Forward Citations

1. 12742678 - Very high resolution spectrometer for monitoring of semiconductor processes (2026-09-22),

2. 12646700 - Multimode configurable spectrometer (2026-06-02),

3. 12449622 - Fiberoptical cable assemblies and interfaces for spectrometers (2025-10-21),

4. 12174071 - System, apparatus, and method for improved background correction and calibration of optical devices (2024-12-24),

5. 11885682 - System, apparatus, and method for spectral filtering (2024-01-30),

6. 11725985 - Signal conversion system for optical sensors (2023-08-15),

7. 11424115 - Multimode configurable spectrometer (2022-08-23),

8. 10923324 - Microwave plasma source (2021-02-16),

9. 10861755 - System and method for measurement of complex structures (2020-12-08),

10. 10794763 - Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer (2020-10-06),

11. 10763144 - Adaptable-modular optical sensor based process control system, and method of operation thereof (2020-09-01),

12. 10679832 - Microwave plasma source (2020-06-09),

13. 10365212 - System and method for calibration of optical signals in semiconductor process systems (2019-07-30),

14. 9997325 - Electron beam exciter for use in chemical analysis in processing systems (2018-06-12),

15. 9842726 - Method and apparatus for the detection of arc events during the plasma processing of a wafer, surface of substrate (2017-12-12),

Company Overview

Verity Instruments, Inc. is a technology company based in Carrollton, Texas, specializing in advanced measurement and testing solutions. The organization focuses on developing innovative instruments that enhance precision and reliability across various industries, including aerospace, automotive, and manufacturing. With a commitment to quality and performance, Verity Instruments aims to provide tools that facilitate rigorous testing and analysis, supporting engineers and researchers in their pursuit of excellence in product development and quality assurance.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

34 Patents

#7 in Carrollton, TX

#543 in Texas

#10,002 in US

#19,612 in the World

Carrollton, TX, United States of America

Verity Instruments, Inc.

Forward Citations = 422

30 inventors:

Mark Anthony Meloni (14 out of 28 patents)

Andrew Weeks Kueny (13 out of 15 patents)

Mike Whelan (12 out of 14 patents)

4. John D Corless (11 out of 11 patents)

5. Larry Arlos Bullock (6 out of 6 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Verity Instruments, Inc.. Retrieved from https://idiyas.com/company/verity-instruments

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…