Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
20 Patents
#4 in Yorba Linda, CA
#3,940 in California
#16,409 in US
#31,295 in the World
Unit Instruments, Inc.
Forward Citations = 571
15 inventors:
Yorba Linda, CA, United States of America
Unit Instruments, Inc.
% Expired Patents = 5.0
Forward Citations = 571
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15 inventors (with patents filed for the assignee):
Kim Ngoc Vu (13 out of 55 patents)
Eric J Redemann (10 out of 10 patents)
Michael J Doyle (4 out of 4 patents)
4. Randall J Vavra (4 out of 4 patents)
5. Nelson Urdaneta (2 out of 3 patents)
6. David P Sheriff (2 out of 2 patents)
7. Dan B LeMay (2 out of 2 patents)
8. Chiun Wang (1 out of 22 patents)
9. John Michael Lull (1 out of 38 patents)
10. David P Sherriff (1 out of 1 patent)
11. James H Doyle, Sr (1 out of 6 patents)
12. Erik Q Tran (1 out of 1 patent)
13. Lam T Nguyen (1 out of 1 patent)
14. Robert Laragione (1 out of 1 patent)
15. Michael D Upchurch (1 out of 1 patent)
20 patents:
Company Overview
Unit Instruments, Inc. is a technology company based in Yorba Linda, California, specializing in advanced instrumentation and measurement solutions. The organization focuses on developing innovative products that enhance precision and efficiency in various applications, particularly in the fields of scientific research and industrial processes. With a commitment to quality and reliability, Unit Instruments serves a diverse clientele, providing tools that facilitate accurate data collection and analysis across multiple sectors.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Unit Instruments, Inc.. Retrieved from https://idiyas.com/company/unit-instruments
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]