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USPTO Data Jan 1 1976 - Oct 6 2026
17 Patents
#3 in Hamilton
#39 in New Zealand
#35,887 in the World
Tru-Test Corporation Limited
Forward Citations = 209
31 inventors:
Tru-Test Corporation Limited
% Expired Patents = 41.2
Trademarks = 8
Forward Citations = 209
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31 inventors (with patents filed for the assignee):
Pieter Cornelis Lunenburg (3 out of 3 patents)
Robert Charles Bryan Woodhead (2 out of 2 patents)
Christopher E Williams (2 out of 10 patents)
4. Michael Brett Heslin (2 out of 2 patents)
5. Anthony R Carson (2 out of 6 patents)
6. Kiet Q Lam (2 out of 3 patents)
7. Brian Frederick Boult (2 out of 2 patents)
8. David James Howell (1 out of 6 patents)
9. John Murphy (1 out of 1 patent)
10. Lawrence Frederick Blount (1 out of 1 patent)
11. Eberhard Juergen Deuss (1 out of 1 patent)
12. David Cristen Greager (1 out of 1 patent)
13. Paul Teal (1 out of 1 patent)
14. Andre Terzagi (1 out of 1 patent)
15. Mark I Gunning (1 out of 2 patents)
17 patents:
10. 6459381 - Apparatus for detecting operation of an electric fence and fence charger (2002-10-01),
11. 6265981 - Apparatus for detecting operation of an electric fence and fence charger (2001-07-24),
Company Overview
Tru-Test Corporation Limited, based in Hamilton, New Zealand, specializes in the development and manufacturing of advanced technology solutions for the agricultural sector. The company focuses on providing innovative products that enhance livestock management and farm productivity. With a strong emphasis on research and development, Tru-Test integrates cutting-edge technology into its offerings, including electronic weighing systems, milk meters, and data management solutions, catering to the needs of farmers and agricultural professionals globally.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Tru-Test Corporation Limited. Retrieved from https://idiyas.com/company/tru-test
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]