The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
May. 06, 2002
Christopher Edward Williams, Grafton, NZ;
Christopher Edward Williams, Grafton, NZ;
Tru-Test Corporation Limited, Hamilton, NZ;
Abstract
Rapid and accurate in-vivo assessment of cerebral white matter injury particularly for pre-term infants, for timely treatment and/or prediction of outcomes has been very limited. This invention exploits the discovery that reduced high-frequency EEG intensity, particularly as shown by the upper spectral edge frequency, is a good indicator of cerebral white matter neural injury and is well correlated with MRI results. With more experience of clinical cases, a set of simple rules such as 'if the spectral edge value is below 8 Hz there is a high likelihood of injury' may be validated, yet the EEG technology involved is largely invisible to the user. In the invention, EEG signals are processed by software to obtain, store, and graphically display bilaterally collected EEG spectral edge and intensity values over from hours to weeks. Rejection of corrupted signals by filtering and gating means is responsive to incoming signal characteristics, to additional inputs such as motion sensors or impedance tests, and to patient data (gestational age in particular). The invention includes the software and methods of use.