Company Badge
USPTO Data Jan 1 1976 - Oct 6 2026
10 Patents
#1 in Lockport, NY
#1,742 in New York
#29,839 in US
#55,986 in the World
Trek, Inc.
Forward Citations = 42
15 inventors:
Lockport, NY, United States of America
Trek, Inc.
% Expired Patents = 40.0
EPO Patents = 3
Trademarks = 6
Forward Citations = 42
Loading Chart...
Loading Chart...
15 inventors (with patents filed for the assignee):
Toshio Uehara (5 out of 9 patents)
Bruce T Williams (5 out of 20 patents)
Jerzy Kieres (3 out of 3 patents)
4. Peter McAnn (2 out of 2 patents)
5. Manabu Tani (2 out of 8 patents)
6. Akiyoshi Itoh (2 out of 5 patents)
7. Katsuji Nakagawa (2 out of 9 patents)
8. Peter R Bossard (2 out of 13 patents)
9. Donnie Herman (1 out of 1 patent)
10. Thomas B Jones (1 out of 8 patents)
11. Maciej A Noras (1 out of 1 patent)
12. Nenad Nenadic (1 out of 1 patent)
13. Kevin D Brown (1 out of 1 patent)
14. Charles Hagen (1 out of 1 patent)
15. Jerry Kieres (1 out of 1 patent)
10 patents:
Company Overview
Trek, Inc. is a technology-driven company based in Lockport, NY, specializing in the development and manufacturing of advanced electronic systems and components. The organization focuses on providing innovative solutions across various sectors, including telecommunications, automotive, and industrial applications. With a commitment to research and development, Trek, Inc. leverages cutting-edge technologies to enhance product performance and reliability, positioning itself as a key player in the evolving landscape of electronic engineering.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Trek, Inc.. Retrieved from https://idiyas.com/company/trek
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
3 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]