For the Inventor, By the Inventor

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Tokyo Seimitsu (Israel) Ltd

USPTO Granted Patents = 2

Forward Citations = 17

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7 inventors (with patents filed for the assignee):

Arie Shahar (1 out of 79 patents)

Niv Shmueli (1 out of 4 patents)

Gilad Golan (1 out of 7 patents)

4. Mark Geshel (1 out of 1 patent)

5. Gideon Friedmann (1 out of 1 patent)

6. Orna Bregman-Amitai (1 out of 3 patents)

7. Jacob Karin (1 out of 4 patents)

2 patents: Sort by Forward Citations

1. 7155052 - Method for pattern inspection (2006-12-26),

2. 6603589 - Circular scanning patterns (2003-08-05),

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USPTO Data Jan 1 1976 - Dec 30 2025

2 Patents

#4,058 in Tokyo

#10,964 in Japan

Tokyo Seimitsu (Israel) Ltd

Forward Citations = 17

7 inventors:

Arie Shahar (1 out of 79 patents)

Niv Shmueli (1 out of 4 patents)

Gilad Golan (1 out of 7 patents)

4. Mark Geshel (1 out of 1 patent)

5. Gideon Friedmann (1 out of 1 patent)

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