Mark Geshel

Title: Mark Geshel: Innovator in Pattern Inspection Technology

Introduction

Mark Geshel is a notable inventor based in Kfar-Sava, Israel. He has made significant contributions to the field of pattern inspection technology. His innovative approach has led to the development of a unique method that enhances the accuracy of identifying defects in patterned surfaces.

Latest Patents

Mark Geshel holds a patent for a "Method for Pattern Inspection." This method employs reference data related to the pattern to create a map for identifying regions expected to generate equivalent images. These regions are then subjected to an image-to-image comparison to identify possible defects. In one implementation, the regions are related by local symmetry operators. In another, disjoint corner features or other features are classified and similar features compared. This patent showcases his expertise in improving inspection processes.

Career Highlights

Mark Geshel is currently employed at Tokyo Seimitsu (Israel) Ltd. His work at this company has allowed him to apply his innovative ideas in a practical setting. His contributions have been instrumental in advancing the company's capabilities in pattern inspection technology.

Collaborations

Mark has collaborated with talented coworkers, including Niv Shmueli and Gideon Friedmann. These collaborations have fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

Mark Geshel's work in pattern inspection technology exemplifies the impact of innovation in enhancing quality control processes. His patent and career achievements reflect his dedication to advancing this field.