The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2006

Filed:

Jun. 10, 2002
Applicants:

Mark Geshel, Kfar-Sava, IL;

Niv Shmueli, Tel Aviv, IL;

Gideon Friedmann, Mevaseret Zion, IL;

Orna Bregman-amitai, Tel Aviv, IL;

Inventors:

Mark Geshel, Kfar-Sava, IL;

Niv Shmueli, Tel Aviv, IL;

Gideon Friedmann, Mevaseret Zion, IL;

Orna Bregman-Amitai, Tel Aviv, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for inspecting a patterned surface employs reference data related to the pattern to provide a map for identifying regions which are expected to generate equivalent images. These regions are then compared in an image-to-image comparison to identify possible defects. In a first implementation, the regions are related by local symmetry operators. In a second, disjoint corner features or other features are classified and similar features compared.


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