For the Inventor, By the Inventor

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Hsinchu, Taiwan

Star Technologies, Inc.

USPTO Granted Patents = 45

EPO Patents = 1

Trademarks = 3

Forward Citations = 390

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29 inventors (with patents filed for the assignee):

Choon Leong Lou (28 out of 34 patents)

Li Min Wang (9 out of 9 patents)

Ho Yeh Chen (8 out of 8 patents)

4. Yi Ming Lau (6 out of 6 patents)

5. Hsiao Ting Tseng (5 out of 5 patents)

6. Choon-Leong Lou (5 out of 5 patents)

7. Mei-Shu Hsu (4 out of 4 patents)

8. Walter R Steiner (3 out of 12 patents)

9. Hsiao Hui Hsieh (2 out of 2 patents)

10. Yong Yu Liu (2 out of 2 patents)

11. Henry H Rich (2 out of 12 patents)

12. Chia Hao Tu (1 out of 1 patent)

13. Chun Wei Peng (1 out of 1 patent)

14. Chen Jung Hsu (1 out of 1 patent)

15. Chao Cheng Tseng (1 out of 1 patent)

Core Competencies:

High-Power Product Switch Protection

Semiconductor Characteristic Measurement

Probing Apparatus

Temperature-Adjusting Mechanism

Display Panel Testing

Probe Card

Integrated Circuit Probing

High-Frequency Signal Testing

Heat Sink Assembly

Graphics Processor Architecture

Digital Phase-Lock Loop

Multifunction Arithmetic Logic Unit

45 patents: Sort by Forward Citations

1. 12498397 - Probe card and thermal conduction device thereof (2025-12-16),

2. 12355430 - High-power product switch protection system and high power product switch protection method (2025-07-08),

3. 11953518 - Switching matrix system and operating method thereof for semiconductor characteristic measurement (2024-04-09),

4. 11828789 - Test apparatus and jumper thereof (2023-11-28),

5. 11754619 - Probing apparatus with temperature-adjusting mechanism (2023-09-12),

6. 11307246 - Probing apparatus and method of operating the same (2022-04-19),

7. 11217649 - Method of testing and analyzing display panel (2022-01-04),

8. 11209462 - Testing apparatus (2021-12-28),

9. 11054465 - Method of operating a probing apparatus (2021-07-06),

10. 11047880 - Probing device (2021-06-29),

11. 10890614 - Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test (2021-01-12),

12. 10184957 - Testing apparatus, holding assembly, and probe card carrier (2019-01-22),

13. 10088502 - Test assembly and method of manufacturing the same (2018-10-02),

14. 9885746 - Switching matrix and testing system for semiconductor characteristic measurement using the same (2018-02-06),

15. 9739830 - Test assembly (2017-08-22),

STAR TECHNOLOGIES, INC. is a leading technology company specializing in software development and IT solutions. With a team of experienced professionals, we provide innovative and reliable technology solutions to businesses of all sizes. Our expertise includes web and mobile application development, cloud computing, cybersecurity, and IT support services. Through our commitment to excellence and customer satisfaction, we have established ourselves as a trusted partner for businesses seeking to leverage technology for growth and efficiency. Visit our website to learn more about our services and how we can help your business thrive in the digital age.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Jan 6 2026

45 Patents

#65 in Hsinchu

#424 in Taiwan

#14,990 in the World

Hsinchu, Taiwan

Star Technologies, Inc.

Forward Citations = 390

29 inventors:

Choon Leong Lou (28 out of 34 patents)

Li Min Wang (9 out of 9 patents)

Ho Yeh Chen (8 out of 8 patents)

4. Yi Ming Lau (6 out of 6 patents)

5. Hsiao Ting Tseng (5 out of 5 patents)

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