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Hsinchu, Taiwan

Star Technologies, Inc.

USPTO Granted Patents = 47

% Expired Patents = 4.3

EPO Patents = 1

Trademarks = 3

Forward Citations = 393

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34 inventors (with patents filed for the assignee):

Choon Leong Lou (29 out of 35 patents)

Li Min Wang (9 out of 9 patents)

Ho Yeh Chen (8 out of 8 patents)

4. Yi Ming Lau (6 out of 6 patents)

5. Hsiao Ting Tseng (5 out of 5 patents)

6. Choon-Leong Lou (5 out of 5 patents)

7. Mei-Shu Hsu (4 out of 4 patents)

8. Walter R Steiner (3 out of 12 patents)

9. Hsiao Hui Hsieh (2 out of 2 patents)

10. Yong Yu Liu (2 out of 2 patents)

11. Henry H Rich (2 out of 12 patents)

12. Chia Hao Tu (1 out of 1 patent)

13. Chun Wei Peng (1 out of 1 patent)

14. Chen Jung Hsu (1 out of 1 patent)

15. Chao Cheng Tseng (1 out of 1 patent)

Core Competencies:

Probe Card

Probing Apparatus

Testing System

Semiconductor Devices

Thermal Management

High-Frequency Signals

Temperature-Adjusting Mechanism

Integrated Circuit

High-Power Switch Protection

Junction Temperature

Multiaxial Stages

Electrical Testing

47 patents: Sort by Forward Citations

1. 12681045 - Probe card, and supporting structure and probe structure thereof (2026-07-14),

2. 12625164 - Probe device, probe system including the probe device and operating method thereof (2026-05-12),

3. 12498397 - Probe card and thermal conduction device thereof (2025-12-16),

4. 12355430 - High-power product switch protection system and high power product switch protection method (2025-07-08),

5. 11953518 - Switching matrix system and operating method thereof for semiconductor characteristic measurement (2024-04-09),

6. 11828789 - Test apparatus and jumper thereof (2023-11-28),

7. 11754619 - Probing apparatus with temperature-adjusting mechanism (2023-09-12),

8. 11307246 - Probing apparatus and method of operating the same (2022-04-19),

9. 11217649 - Method of testing and analyzing display panel (2022-01-04),

10. 11209462 - Testing apparatus (2021-12-28),

11. 11054465 - Method of operating a probing apparatus (2021-07-06),

12. 11047880 - Probing device (2021-06-29),

13. 10890614 - Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test (2021-01-12),

14. 10184957 - Testing apparatus, holding assembly, and probe card carrier (2019-01-22),

15. 10088502 - Test assembly and method of manufacturing the same (2018-10-02),

Company Overview

Star Technologies, Inc., based in Hsinchu, Taiwan, specializes in advanced solutions for semiconductor testing and measurement. The company focuses on high-power product switch protection, semiconductor characteristic measurement, and integrated circuit probing. Its innovative technologies include probing apparatus, temperature-adjusting mechanisms, and high-frequency signal testing, catering to the evolving needs of the semiconductor industry. Star Technologies is committed to enhancing the efficiency and reliability of display panel testing and probe card applications.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

47 Patents

#98 in Hsinchu

#421 in Taiwan

#14,827 in the World

Hsinchu, Taiwan

Star Technologies, Inc.

Forward Citations = 393

34 inventors:

Choon Leong Lou (29 out of 35 patents)

Li Min Wang (9 out of 9 patents)

Ho Yeh Chen (8 out of 8 patents)

4. Yi Ming Lau (6 out of 6 patents)

5. Hsiao Ting Tseng (5 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Star Technologies, Inc.. Retrieved from https://idiyas.com/company/star-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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