The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Apr. 03, 2020
Applicant:

Star Technologies, Inc., Hsinchu, TW;

Inventor:

Choon Leong Lou, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/32 (2006.01); G02F 1/1368 (2006.01); H01L 51/56 (2006.01); H01L 21/66 (2006.01); G02F 1/136 (2006.01);
U.S. Cl.
CPC ...
H01L 27/3265 (2013.01); G02F 1/1368 (2013.01); H01L 22/12 (2013.01); H01L 22/20 (2013.01); H01L 27/3262 (2013.01); H01L 51/56 (2013.01); G02F 1/13606 (2021.01);
Abstract

A method for testing and analyzing a display panel, comprising: providing a display panel including a circuitry and a pixel connected to the circuitry, wherein the pixel includes a capacitor, a transistor and an electrode electrically connected to the capacitor and the transistor; measuring a first parameter of the display panel; disabling the pixel; measuring a second parameter of the display panel; and deriving a third parameter of the pixel by subtracting the second parameter from the first parameter.


Find Patent Forward Citations

Lou, Choon. (2022). Method of testing and analyzing display panel (U.S. Patent No. 11217649). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11217649

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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